Materials Engineering, Inc.
47W605 I.C. Trail
Virgil, IL 60151
Contamination Analysis
Our support can range from simple elemental identification, to complete investigation of the contamination source and implementation of a corrective action strategy.
Contamination is a problem common to many industries and products. Using Scanning Electron Microscopy (SEM) with Energy Dispersive Spectroscopy (EDS), Micro Fourier Transform Infrared Spectroscopy (Micro-FTIR) and Gas Chromatography - Mass Spectrometry (GC-MS), Materials Engineering, Inc. can identify the constituents present in surface contaminants, filtrates, sludges or residues, even if only a minute quantity is available. Our EDS can detect all elements down to boron, atomic number 5, and our GC-MS and Micro-FTIR can evaluate all organic species, allowing us to identify virtually any contaminant.
Learn more about SEM/EDS in the 2001 MEi newsletter.
Identification of
• Contaminants
• Residues
• Corrosion Products
• Sludges
• Filtrates
• Filters and Patches
• Wear Debris
• Oil/Grease Films
• Foreign Particles
• Surface Spots or Discoloration
• Odors or Smells
• Residual Solvents
• Residual Monomers
• Phthalate Plasticizers
• Bisphenol A, or BPA
Common Applications
• Plating and Metal Finishing
• Electronics
• Medical Products
• Chemical Processing
• Brazing and Soldering
• Castings
• Bearings and Wear Components
• Cleanliness Critical Processing
• Plastic Components
• Molded Parts
Once the contaminant has been identified, its source can be tracked down. Common sources of contamination are corrosion, wear and external or foreign objects. Once the source is determined, the problem can be eliminated.
Next: Polymer Analysis